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Embedded Systems Technology in Test & Measurement
Embedded Systems Technology in Test & Measurement
Test and measurement system designers have more options available to tackle demanding applications like ultra-wide band and millimeter wave test. Modular systems allow incorporation of multiple components that can streamline automation as well as provide developers with more sophisticated tools for tracking down problems as well as certifying systems.
What’s Inside
New Challenges for Test and Measurement Systems
PXI Express Chassis – Modular Platform for Automation and Test Systems
Joint Effort Develops T&M Capabilities for UWB Technologies
Power Supplies Boost Efficiency with Up To Four Independent Channels
Demand Grows for Innovations in mmWave Test
Essential guide to select an integrated COM Express system
Bill Wong
Content Director for Electronic Design and MWRF
Bill Wong covers Digital, Embedded, Systems and Software topics at Electronic Design. He writes a number of columns, including Lab Bench and alt.embedded, plus Bill’s Workbench hands-on column. Bill is a Georgia Tech alumni with a B.S in Electrical Engineering and a master’s degree in computer science for Rutgers, The State University of New Jersey.
He has written a dozen books and was the first Director of PC Labs at PC Magazine. He has worked in the computer and publication industry for almost 40 years and has been with Electronic Design since 2000. He helps run the Mercer Science and Engineering Fair in Mercer County, NJ.
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